SRINIVASA RAO VEMULA. EXPLORING CHALLENGES AND OPPORTUNITIES IN TEST AUTOMATION FOR IOT DEVICES AND SYSTEMS. INTERNATIONAL JOURNAL OF COMPUTER ENGINEERING AND TECHNOLOGY (IJCET), [S. l.], v. 15, n. 4, p. 39–52, 2024. Disponível em: https://lib-index.com/index.php/IJCET/article/view/IJCET_15_04_004.. Acesso em: 6 oct. 2025.